Researchers at Sandia National Laboratories have developed electro-thermo-chemical random-access memory, a technology that uses localized heating and electrical pulses to store a range of analog values instead of binary ones and zeros, making future electronics more energy efficient.
Researchers at the Fraunhofer Institute for Ceramic Technologies and Systems, Germany, have developed an optical coherence tomography testing system that non-destructively detects seal defects in real time during film packaging processes.
Researchers at the Department of Energy’s Oak Ridge National Laboratory have developed SimuScan, an artificial intelligence framework that uses realistic synthetic data to train AI to identify nanoscale features and autonomously target the most informative regions of a sample.
Hitachi High-Tech Corporation, Japan, established the Innovation Center Eindhoven at the High Tech Campus Eindhoven in the Netherlands.
Innovative Circuits Engineering Inc., San Jose, Calif., a leader in semiconductor reliability testing solutions, launched its latest innovation: the eM808 bHAST system—now enhanced with in-situ monitoring capabilities previously available only on high temperature operating life systems.
