Amkor Technology Inc., Tempe, Ariz., announces plans to invest $60 million to expand its state-of-the-art assembly and test factory located in China’s Shanghai Waigaoqiao Free Trade Zone.
Hybrid instrument combines photonic-nanomechanical force microscopy and nanospectroscopy
Oxford Instruments launches silicon drift detector with ultrahigh resolution at low kV
Oxford Instruments, U.K., has launched X-Max Extreme, a silicon drift detector for ultrahigh resolution FEG and FIB-SEM applications.
University of Arkansas to develop circuit simulation model for GaN devices
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