February 2016 Issue of Electronic Device Failure Analysis, a quarterly publication providing a technical condensation of information of interest to electronic device failure analysis technicians, engineers, and managers.
Struers Inc., Cleveland, Ohio, introduces its new LaboSystem, a modular polishing system offering a choice of three LaboPol polishers, three LaboForce specimen movers, and two LaboDosers.
Carl Zeiss X-ray Microscopy Inc., Germany, introduces the Xradia Versa X-ray 500-series of 3D X-ray microscopes with FPX flat panel extension, which enhances imaging flexibility and creates workflow efficiencies.
February 2016 Issue of Advanced Materials & Processes, featuring: Kinetically Activated Bainite Welds; Field Assisted Sintering; Metallurgy Lane Pioneers in Metals Research; and iTSSe Newsletter
Researchers from the California NanoSystems Institute at UCLA have reportedly developed a new technique that greatly enhances digital microscopy images.
