By modifying an existing technique for identifying defects, researchers at the National Institute of Standards and Technology, Gaithersburg, Md., have developed a method that can simultaneously locate individual electrical flaws in multiple microcircuits on the same chip.
Researchers at the U.S. Department of Energy’s Argonne National Laboratory, Lemont, Ill., developed a new technique that accelerates the solving of material structures from patterns uncovered in x-ray experiments.
Leading semiconductor test equipment supplier Advantest Corp., Japan, announced the latest addition to its extended power supply card series: the DC Scale XPS128+HV, developed to lower the cost of testing for power management ICs and other high-voltage devices.
Atomica Corp, Santa Barbara, Calif., a leader of micro-electro-mechanical systems, raised $30 million in Series C financing.
American Elements announced that its engineers have invented a novel nanoscale electrolyte material for use in cutting-edge lithium-sulfur battery technology.
