The July/August issue of Advanced Materials & Processes magazine has an editorial focus on Additive Manufacturing.
Advanced Material and Processes, Volume 180, Issue 5, July/August 2022
Counterfeit chips a problem as global shortage increases semiconductor fraud
According to ERAI Inc., Naples, Fla., the world’s leader in counterfeit electronics databases, 2021 saw record wire-fraud cases reported by desperate buyers.
New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields
Oxford Instruments Asylum Research, Santa Barbara, Calif., launched its new Cypher L atomic force microscope, designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage.
Institute for Factory Automation and Production Systems installs Tescan Amber X Plasma FIB-SEM for diverse set of materials research projects
Tescan Orsay Holding a.s., Czech Republic, announces the installation of the Amber X focused ion beam-scanning electron microscope at the Institute for Factory Automation and Production Systems in Germany.
New metrological technique uses stress for nanotomography
Researchers from the Skolkovo Institute of Science and Technology (Skoltech) and their colleagues in Russia and Spain demonstrated proof-of-concept of a new radiation-safe method for mapping the internal structure and stress distribution in samples of materials at the nanoscale, with a resolution about 100 times higher than that of the x-ray and neutron tomography techniques currently available.