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Home Search results for: -/journal_content/56/10192/19549253/PUBLICATION

N.J. man charged after feds seize $17.5M in counterfeit electronics

A Bergen County, N.J. man was arrested and charged with taking part in a multimillion-dollar conspiracy to sell counterfeit computer networking devices on Amazon and other online retail websites.

Bruker introduces XFlash 7, the next generation of EDS detectors for elemental analysis in electron microscopes

Bruker Corp., Germany, introduced the new XFlash 7 detector series for its QUANTAX energy dispersive x-ray spectrometer systems, enabling chemical analysis of material samples in electron microscopes with ultimate speed, sensitivity, and reliability.

Onsemi unveils world’s first TOLL-packaged 650 V SiC MOSFET

Onsemi, Phoenix, announced the world’s first TO-leadless packaged silicon carbide MOSFET at PCIM Europe.

Hitachi High-Tech sets a new pace for plating and coatings analysis with the new FT230

Hitachi High-Tech Analytical Science, England, a global company within Hitachi High-Tech Group, Japan, has expanded its plating and coatings analysis range with the launch of the breakaway FT230.

New thermal management technology for electronic devices reduces bulk while improving cooling

A team from the University of Illinois at Urbana-Champaign , Ill., and UC Berkeley, Calif., published a paper in Nature Electronics detailing a new cooling method that offers a host of benefits, not the least of which is space efficiency that offers a substantial increase over conventional approaches in devices’ power per unit volume.

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