Traveling To Leadership Day Financing Your Trip To Leadership Day While there is no registration fee for active ASM members to attend Leadership Day*, attendees are responsible for their own travel and lodging expenses. These expenses are generally reimbursed by the attendee’s employer or the local Chapter. *While co-located and hosted during the IMAT conference, […]
High-resolution array ICP-OES enables flexibility and high-precision measurement of trace elements
Analytik Jena AG, Germany, introduces the PlasmaQuant PQ 9000, its first High-Resolution Array ICP OES (optical emission spectrometry using inductively coupled plasma) for multiple element analysis.
Ultrasonic phased array produces high-resolution 3D images
Researchers at the Fraunhofer Institute for Nondestructive Testing IZFP, Germany, have developed an ultrasonic phased-array instrument that enables them to produce high-resolution 3D images.
Zeiss 340 and 540 FIB-SEMs feature high-speed processing observed in real time
Carl Zeiss Microscopy, Peabody, Mass., introduces the first system of the new Crossbeam 340 and 540 series FIB-SEMs for nanotomography and nanofabrication.
SUSS MicroTec launches projection scanner for advanced packaging
SUSS MicroTec, Germany, has launched the DSC300 Gen2 projection scanner, a platform for wafer sizes up to 300 mm based on the projection lithography technology developed by SUSS MicroTec Photonic Systems Inc. (formerly Tamarack Scientific).