Agilent Technologies Inc., Santa Clara, Ca., announced the availability of its 7500 atomic force microscope (AFM), a highly advanced instrument that establishes new performance, functionality and ease-of-use benchmarks for nanoscale measurement, characterization and manipulation.
Gatan and JEOL joint venture improves 3D imaging
JEOL Ltd., Peabody, Mass., announces a joint initiative between JEOL and Gatan that brings the power of Serial Block Face Imaging to the JEOL family of scanning electron microscopes. Researchers will be able to image 3D structures of materials samples at ultrahigh resolution using the JEOL JSM-7100F Field Emission Scanning Electron Microscope with an integrated Gatan 3View Serial Block Face Imaging System.
Ultrafast TEM enables study of ultrafast events at molecular scale
FEI Co., Hillsboro, Ore., introduces the Tecnai Femto ultrafast transmission electron microscope (UEM), enabling scientists to explore ultrafast events and processes that occur at the atomic and molecular spatial scale over time spans measured in femtoseconds (10-15 seconds).
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Past Leadership Days
Past Leadership Days *All Powerpoint presentations and materials distributed during this event are available in your ASM Chapter Workspace. Please choose the Manage Your Chapter Folder, then Leadership Days