Bruker Nano Analytics, Madison, Wis., has developed XFlash FlatQuad, a side-entry silicon drift detector positioned between the SEM pole piece and sample.
XFlash FlatQuad SDD enables high vacuum and low beam-current EDS analysis
Zeiss hardware/software package streamlines image acquisition and extends capacity of SEMs
Zeiss, Pleasanton, Calif., introduces the Zeiss Atlas 5, a powerful hardware and software package that extends the capacity of its scanning electron microscopes (SEM) and focused ion beam SEMs (FIB-SEM).
Austria’s AMS to invest $2 billion in new fab in New York state
AMS AG, Austria, formerly Austriamicrosystem, plans to locate a new 360,000 sq. ft. fab in upstate New York at the Nano Utica site in Marcy to manufacture analog devices on 200/300 mm wafers.
DOD awards $75 million to FlexTech Alliance for flexible hybrid electronics
FlexTech Alliance, San Jose, Calif., announces that the U.S. Department of Defense has awarded it $75 million over five years in a Cooperative Agreement to establish and manage a Manufacturing Innovation Institute (MII) for Flexible Hybrid Electronics (FHE MII).
Proceq Equotip 550 portable instrument for hardness testing diagnoses roll imperfections
Proceq, Switzerland, introduces the Equotip 550 Leeb U roll hardness tester, designed for testing small, midsize, and large paper rolls, as well as thin-film, foil, and coated rolls.