Bruker’s Nano Surfaces Division, San Jose, Calif., announces a nanoscale scratch option for its NanoForce Nanomechanical Testing System.
Bruker introduces nano-scratch capability for nanomechanical testing
Metamaterials enable the first optically controlled electronic devices
Engineers from the Applied Electromagnetics Group at the University of California San Diego report that they have fabricated the first semiconductor-free, optically controlled microelectronic device.
Astronics Test Systems semiconductor test platform processes 396 devices at once
Astronics Test Systems, East Aurora, N.Y., introduces its ATS 5034 System-Level Test Platform that improves production efficiency and greatly reduces costs by processing up to 396 devices simultaneously.
Samsung expands its advanced foundry products portfolio with 14LPU/10LPU processes
Samsung Electronics Co. Ltd., Japan, announced at its Device Solutions America headquarters in San Jose, Calif., that it is expanding its advanced foundry process technology products with the fourth-generation 14-nm process and the third-generation 10-nm process.
Zeiss and ASML strengthen partnership for EUV semiconductor lithography
ASML Holding NV, Netherlands, and Carl Zeiss SMT, Germany, have agreed to strengthen their partnership in the semiconductor lithography business to facilitate the development of the next generation of extreme ultraviolet (EUV) lithography systems.