ASM Industry News
ASM Industry News
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May 20, 2019Rigaku, Japan, introduces its new Smart Sample Loading System (SSLS), in which a vacuum chuck can be used to load samples into pre-loaded sample holders, saving time and increasing the number of samples that can be held on the sample deck
May 20, 2019Hitachi High-Technologies Corp., Tokyo, announces that it will commence sales of the SU3800 and the oversized SU3900 scanning electron microscopes, which feature the ability to accommodate large, heavy specimens, along with advanced functionalities for automated measurement and wide-angle camera navigation.
May 17, 2019The Semiconductor Industry Association, Washington, has released a set of government policy recommendations for sustaining and strengthening America’s global leadership in semiconductor technology and ensuring that the United States wins the race to harness the transformative semiconductor-enabled technologies of the future.
May 17, 2019This ITSC presentation focuses on the fact that drilling is a major cost factor to mining operations (exploration, drill and blast operations), and wear of components is a significant driver of drilling costs.
May 17, 2019This ITSC 2019 presentation discusses the plasma treatment of large-scale substrates, because the size of semiconductor and flat-panel-display (FPD) production equipment for dry etching and sputtering has been increasing due to the increased size of silicon wafers and the FPD.
May 17, 2019GKN Powder Metallurgy announces that it has opened its new North American Powder Metallurgy Headquarters and Additive Manufacturing Customer Center in Auburn Hills, Michigan.
May 17, 2019Veeco Instruments Inc., Plainview, N.Y., announces that SkyWater Technology Foundry has taken delivery of the WaferStorm single wafer wet process system to support advanced development work for the design and fabrication of next-generation 3D monolithic System-on-a-Chip (3DSoC) technology.
May 17, 2019Nanotronics, Brooklyn, N.Y., has expanded its Super Resolution imaging system portfolio with a new patented system that identifies and classifies defects at lower resolutions than traditional inspection microscopy, providing faster scan times and enhanced throughput.
May 17, 2019This ITSC 2019 paper details the mechanical testing of Al 6061 cold spray coatings before and after a rapid heat treatment with a novel focused IR device.