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Advantest develops test capabilities for 5G medical devices, mobile electronics
December 15, 2018
Source: ASM International
Advantest Corp., Tokyo, has developed advanced test solutions that enable 5G connectivity for such diverse applications as mobile electronics, medical devices, automotive systems, retail business, and big data.
“The product portfolio that we have – and are continuing to develop – is designed to meet the global market’s requirements for 5G in applications from next-gen smart phones to connected cars,” says Judy Davies, Advantest’s vice president of global marketing communications.
Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both today’s and emerging LTE, LTE-Advanced, and LTE-A Pro smart phones, as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. The cards’ advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test.
The company has announced eight new systems and enhancements the past year. These include three new members of the B6700 product family of burn-in memory testers: models B6700D, -S and –L, which are designed to boost parallel testing capacity and lower the cost of test for NAND flash devices.
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