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Covalent Metrology and Rigaku partner to deliver new semiconductor lab resources

December 16, 2018
Source: ASM International

Covalent Metrology, Sunnyvale, Calif., a provider of analytical services, announces a new partnership with Rigaku Corp., Japan, a global leader in X-ray analytical instrumentation, to support American high-tech industries with the most advanced metrology capabilities in the world.

Under the terms of this agreement, Rigaku will be supplying Covalent with several state-of-the-art instruments for its new facility in Sunnyvale, California. This collaboration agreement provides Covalent with exceptional analytical service capabilities and gives Rigaku a North American demonstration facility located in the heart of Silicon Valley.

The Rigaku Semiconductor Metrology Division designs and manufactures X-ray based measurement tools to solve semiconductor manufacturing challenges. With over 35 years of global market leadership in the semiconductor industry, Rigaku metrology tools employ X-ray fluorescence (XRF), X-ray diffraction (XRD), X-ray reflectometry (XRR) and Critical-Dimension Small-Angle X-ray Scattering (CD-SAXS) techniques, enabling everything from in-fab process control metrology to R&D for thin film and materials characterization.

Covalent Metrology provides imaging and characterization services to support R&D, defect analysis, and quality control for companies in semiconductors, solar, medical devices, MEMS and other industries. Covalent’s analytical services include atomic force microscopy (AFM), X-ray XRD/XRR, high-resolution X-ray diffraction (HR-XRD), scanning electron microscopy (SEM), spectral ellipsometry, optical profilometry, UV-VIS-NIR spectrophotometry, TEM, XPS, TOF-SIMS and many others.

Subject Classifications

Industries and Applications | Electronics

Materials Testing and Evaluation | Failure Analysis

Materials Testing and Evaluation | Material Selection

Materials Testing and Evaluation | Materials Characterization

Materials Testing and Evaluation | Microelectronic Failure Analysis

Materials Testing and Evaluation | Nondestructive Testing

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