Professional Development

Professional Development

 

Microscopy

 

ASM Education Symposium

REGISTER HERE

Topic:  The Cleveland Chapter of ASMI will be offering a one-day technical symposium.  The symposium is the Chapter’s annual education event and provides Chapter members and other interested parties the opportunity to improve their knowledge and network on the current topic. 

 

     Location:  Ohio Aerospace Institute  

     22800 Cedar Point Rd, Brook Park, OH

     Date: June 6, 2018

     Time: 8:00AM-5:00PM

     Audience:  Engineers, sales, marketing, students, teachers.

Speakers and Topics:

Topic

Speaker

Affiliation

TEM Sample Preparation and Optical Microscopy

Pablo Mendoza

Allied High Tech Products, Inc.

Optical Microscopy and Scanning Electron Microscopy (SEM)

TBD

NSL Analytical

SEM/FIB and Transmission Electron Microscopy (TEM)

Dr. Danqi Wang

Swagelok Center for Surface Analysis of Materials, CWRU

Electron Backscattered Diffraction (EBSD)

Dr. Carole Trybus

Materion

X-ray Computed Tomography

Mark Riccio

Carl Zeiss Microscopy

Image Analysis

Dr. John Sosa

MIPAR

Introduction to Time-of-flight Secondary Ion Mass Spectroscopy (Tof-SIMS) – Applications in science and technology

Dr. Kévin Abbasi

Swagelok Center for Surface Analysis of Materials, CWRU

Atom Probe Tomography

Talia Barth

University of Michigan

 

Talks should provide an overview of the topic, local involvement in the field, state-of-the art, weaknesses and deficiencies, and estimation of future trends. 

Exhibits:  In addition to talks, attendees are welcome to bring company displays and literature highlighting their contributions to this and other engineering fields.

Registration:  Registration fee is $100. Students $20.  Registrants will receive 6 hours of CEU time towards their PE license. REGISTER HERE