Conference Proceedings

Conference Proceedings

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ISTFA 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis

Published: 2015

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!

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ISTFA 2014: Proceedings of the 40th International Symposium for Testing and Failure Analysis (November 9–13, 2014, Houston, Texas, USA)

Published: 2014

"Exploring the Many Facets of Failure Analysis," is the theme of the 40th International Symposium for Testing and Failure Analysis (ISTFA 2014), November 9–13, 2014, at the George R. Brown Convention Center in Houston, Texas, USA.

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ISTFA 2013: Proceedings from the 39th International Symposium for Testing and Failure Analysis, A Complete Proceedings

Published: 2013

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

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ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis

Published: 2012

Complete proceedings, 105 papers, from ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, November 11-15, 2012, Phoenix, Arizona,

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ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis

Published: November 01, 2011

Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose, California,

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ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis

Published: October 01, 2004

The ISTFA conference proceedings are an integral part of technical libraries, failure analysis (FA) laboratories and related industries. This 30th edition represents a comprehensive reference of the state-of-the art research, development, tools and techniques presented at ISTFA 2004.

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ISTFA 2002: Proceedings from the 28th International Symposium for Testing and Failure Analysis

Published: October 01, 2002

The ISTFA conference proceedings are an integral part of technical libraries, failure analysis (FA) laboratories and related industries. This 28th edition represents a comprehensive reference of the state-of-the art research, development, tools and techniques presented at ISTFA 2002.

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ISTFA 2000: Proceedings from the 26th International Symposium for Testing and Failure Analysis

Published: 2000

This ISTFA marks the beginning of the new millennium. The state of the art in microelectronics technology greatly exceeds the predictions made just a short time ago. The rapid development of microelectronics has enabled us to reach levels of integration, operating speed, reliability, and even cost that were not imagined a generation ago.

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ISTFA 1999: Proceedings of the 25th International Symposium for Testing and Failure Analysis

Published: October 01, 1999

This Failure Analysis symposium brings you the latest in techniques along with novel approaches to solving some unique and more common problems. We have even added a Software session this year and will continue to add categories as methods and devices change each year.

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ISTFA 1996: Proceedings from the 22nd International Symposium for Testing and Failure Analysis

Published: 1996

Proceedings of the 22nd International Symposium for Testing and Failure Analysis, 18-22 November, Los Angeles, California. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis.

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