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Atomic force microscope from Asylum Research scans surface ten times faster at high resolution

January 21, 2019

Oxford Instruments Asylum Research, U.K., introduces the Cypher VRS AFM, a full-featured video-rate atomic force microscope that enables researchers to measure nanoscale dynamic processes at video-rate speeds with all of the resolution, versatility, and ease of use of an Asylum Research Cypher AFM.

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Keyence VHX 6000 microscope combines brightfield and darkfield for optimal lighting

January 21, 2019

Keyence, Japan, offers the VHX-6000 digital microscope with the capability to view, capture, and measure at magnifications ranging from 20X to 2000X.

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Tescan USA welcomes EDFAS member Dr. Lucille Giannuzzi as Regional Sales Manager

January 19, 2019

Tescan USA Inc., Warrendale, Pa., announces that it has hired EDFAS member Dr. Lucille Giannuzzi as Regional Sales Manager for the Mid-Atlantic region because of her extensive experience in focused ion beam, scanning electron, and transmission electron microscopy, as well as her applications expertise in both the physical and life sciences.

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Thermo Scientific’s Lumis EBSD detector incorporates new CMOS sensor, advanced optics

January 19, 2019

Thermo Scientific, Waltham, Mass., introduces the Lumis EBSD detector, which can rapidly identify crystallographic phases, grain sizes, and orientation, as well as monitor structural transformations in SEM samples.

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Zeiss invests $45 million in facility near Detroit for metrology and nondestructive testing

January 19, 2019

Zeiss, Germany, has begun construction of a new 82,000 square foot facility outside Detroit that will be capable of surface defect detection, multidimensional measurement, nondestructive testing, and surface form and geometry analysis.

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Nikon wafer loader enables highly reliable loading of wafers 100 microns thick

January 19, 2019

Nikon, Japan, introduces the NWL200 series, the first lineup of wafer loaders for inspection microscopes capable of loading 100-micron thin wafers.

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Veeco wins Innovation Award for its GENxcel R&D molecular beam epitaxy system

January 19, 2019

Veeco Instruments Inc., Plainview, N.Y., announces that its GENxcel R&D Molecular Beam Epitaxy System earned the 2018 Compound Semiconductor (CS) Industry Innovation Award.

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Global semiconductor sales reported to increase 9.8% year-to-year in November

January 19, 2019

The Semiconductor Industry Association (SIA), Washington, announces that worldwide sales of semiconductors reached $41.4 billion for the month of November 2018, an increase of 9.8 percent from the November 2017 total of $37.7 billion, and 1.1 percent less than the October 2018 total of $41.8 billion.

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Bruker completes acquisition of Alicona for its optical 3D surface measurement solutions

January 19, 2019

Bruker Corp., Billerica, Mass., announces that it has completed its previously announced acquisition of Alicona Imaging GmbH, a leading provider of optical-based metrology products in Austria.

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ASM member Julien Noel named Vice President/General Manager of Buehler

January 08, 2019

ITW Test and Measurement Group President Yahya Gharagozlou has named ASM member Julien Noel Vice President/General Manager of its Buehler worldwide division.

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ASM Affiliate Societies