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Electronics and Failure Analysis

Author: Jerry Soden, Jaume Segura, Charles F. Hawkins, Sandia National Labs   |   Document Download   |   Product code: ZMEFA2011P128

File size: 1 MB

Classified as: Electronics

Price: $25.00 Member Price: $20.00
Five years ago, we described our knowledge of CMOS IC defects, and how they manifested as electronic failures. The emphasis was on bridge and open defects with a short description of parametric failures. Now, with technology scaling entering the nanometer regime, parametric failures are a major concern often presenting difficult detection and fail site location. We have thus expanded the section on parametric failures showing the reasons for their increased significance in advanced process technologies, and the failure analysis tools available to face the problem.
  • From: Microelectronics Failure Analysis, Desk Reference Sixth Edition
  • Published: October 01, 2011
  • Pages: 21
  • Review Type: Peer reviewed