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Introduction to Laser Voltage Probing (LVP) of Integrated Circuits

Author: Siva Kolachina, Texas Instruments Inc   |   Document Download   |   Product code: ZMEFA2011P349

File size: 783 KB

Classified as: Electronic Materials Electronics

Price: $25.00 Member Price: $20.00
In this article, an introductory overview of the Laser Voltage Probing (LVP) is presented. LVP is used for waveform analysis and design debug of flipchip packaged integrated circuits (IC). The basics of LVP and its implementation are presented. Variants in LVP methodologies and instrumentation are discussed. References provided allow the reader to further obtain in-depth knowledge of this subject.
  • From: Microelectronics Failure Analysis, Desk Reference Sixth Edition
  • Published: October 01, 2011
  • Pages: 5
  • Review Type: Peer reviewed