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Keep up-to-date on the latest advances in the metals and materials industry with ASM Industry News.

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DualBeam FIB-SEM microscope for semiconductors includes new feedback systems

March 21, 2019

Thermo Fisher Scientific, Waltham, Mass., introduces its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer scale materials characterization and analysis: the Thermo Scientific Helios 5 DualBeam microscope.

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Rigaku EDXRF instrument analyzes elements from Na through U in almost any matrix

March 21, 2019

Rigaku, Japan, announces the newest addition to the NEX DE series, the Rigaku NEX DE VS direct excitation variable-spot EDXRF elemental analyzer, which is uniquely suited for small spot analysis applications.

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Witec analysis tool enables Raman microscopes to identify and classify particles

March 21, 2019

Witec GmbH, Germany, pioneer of Raman imaging and correlative microscopy, introduces ParticleScout, a particle analysis tool that enables researchers to find, classify, quantify, and identify particles quickly and easily with the Alpha300 Raman microscope series.

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Bruker wins IF Design awards for three different products

March 21, 2019

Bruker, Munich, has been awarded the IF (International Forum) Design Award for three different products: the FT-IR spectrometers Invenio and Alpha II, as well as the FT-NIR spectrometer MPA II in the categories “Industry” and “Medicine/Health” of the discipline “Product Design.”

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Fujifilm Electronic Materials invests $91 million to expand manufacturing in Arizona

March 18, 2019

Fujifilm Electronic Materials U.S.A., a subsidiary of Tokyo-based Fujifilm Holdings Corp., recently began a $91 million investment project focused on the company's manufacturing and development facilities in Mesa, Arizona.

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Mineral and organic acids extract rare earth elements from phosphate rock waste

March 11, 2019

Researchers from Rutgers University-New Brunswick, N.J., and members of the Critical Materials Institute in Ames, Iowa, announce that they have found a possible new source of rare earth elements in phosphate rock waste, and have developed an environmentally friendly way to extract the elements.

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Asylum Research Jupiter AFM provides 200-mm sample access and higher resolution

March 11, 2019

Oxford Instruments Asylum Research, Santa Barbara, Calif., announces the new Jupiter XR Atomic Force Microscope, the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.

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Buehler’s new Wilson universal hardness testers can hold several indenters and objectives

February 20, 2019

Buehler, Lake Bluff, Ill., introduces the Wilson UH4000 series universal hardness testers, which are designed for high-volume production labs and the production floor.

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Buehler AutoMet grinder-polishers feature intuitive touch screen, z-axis material removal

February 19, 2019

Buehler, Lake Bluff, Ill., an ITW company, introduces the AutoMet family of semi-automatic grinder-polishers that feature a new intuitive touch screen interface that is simple to learn and quick to operate.

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Soitec expands collaboration with Samsung Foundry on fully depleted SOI wafer supply

February 19, 2019

Soitec, France, announces an expanded collaboration with Samsung Foundry to ensure the volume supply of fully depleted silicon-on-insulator (FD-SOI) wafers.

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