ASM Industry News
ASM Industry News
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March 22, 2019Eastern Applied Research, Buffalo, N.Y., recently named as an Authorized Distributor of Hitachi High-Tech Science Corp., now offers an XRF analyzer developed for ultrathin film measurements and micro-spot analysis needs: the Hitachi FT-150 series.
March 22, 2019Paragraf, a recent University of Cambridge spin-out company in England, has started producing graphene – a sheet of carbon just one atomic layer thick – at up to eight inches (20 cm) in diameter, large enough for commercial electronic devices.
March 22, 2019Rigaku, Japan, announces the newest addition to the NEX DE series, the Rigaku NEX DE VS direct excitation variable-spot EDXRF elemental analyzer, which is uniquely suited for small spot analysis applications.
March 22, 2019Bruker, Munich, has been awarded the IF (International Forum) Design Award for three different products: the FT-IR spectrometers Invenio and Alpha II, as well as the FT-NIR spectrometer MPA II in the categories “Industry” and “Medicine/Health” of the discipline “Product Design.”
March 22, 2019SEMI, Mil[pitas, Calif., the global industry association serving the electronics manufacturing supply chain, announces SEMI Works, a comprehensive program to attract, develop and retain the talent critical to the worldwide electronics industry’s continued innovation and growth.
March 22, 2019Thermo Fisher Scientific, Waltham, Mass., introduces its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer-scale materials characterization and analysis: the Thermo Scientific Helios 5 DualBeam microscope.
March 22, 2019Applied Materials Inc., Santa Clara, Calif., has been recognized by Intel as a recipient of a 2018 Preferred Quality Supplier (PQS) award.
March 21, 2019Leica Microsystems, Buffalo Grove, Ill., introduces the Leica DM3 XL microscope system that includes a macro objective enabling a 30% increase in field of view and a wide choice of different stage inserts: metal inserts, wafer holders, and mask holders.
March 21, 2019Keyence, Itasca, Ill., has launched its new VL Series of 3D Scanner CMM, which provides a structured light scanner with full 360 degree measurement and claims fully traceable measurements of ±10 μm accuracy with 2 µm repeatability.
March 21, 2019Thermo Fisher Scientific, Waltham, Mass., introduces its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer scale materials characterization and analysis: the Thermo Scientific Helios 5 DualBeam microscope.