International Metallographic Contest

International Metallographic Contest

2018 International Metallographic Contest

The International Metallographic Contest and Exhibit is being held in conjunction with the 2018 Materials Science & Technology (MS&T) Conference & Exhibition at the Greater Columbus Convention Center in Columbus, OH, October 14-18, 2018. The contest features the best work of metallographers and microstructural analysts from around the world. Entrants need not be members of the International Metallographic Society (IMS) or ASM International, and are not required to attend the MS&T Conference.

Purpose
The primary goal of the contest is to advance the science of microstructural analysis by providing an opportunity for those interested in material properties and characterization to display their work and communicate significant scientific information.  There are five different classes of competition covering all fields of optical and electron microscopy.  In Classes 1 through 3, multiple images and captions in a poster format are expected to be used to describe how microscopy was used to help characterize a material or process, solve a problem, or to describe a unique or unusual microscopy/metallographic technique.  Classes 4 and 5 are for artistic images of interesting or unique microstructure and surface morphologies. The contest is open to all interested individuals and groups.  IMS or ASM membership, or 2018 MS&T Conference & Exhibition attendance is not required to enter the IMC.

IMS or ASM officers, IMC award sponsors, and commercial exhibitors may enter in any class to compete for cash awards including Best in Show.  If an entry submitted by IMS or ASM officers, IMC award sponsors, or a commercial exhibitors receives a first place award in any class, then the submitter is prohibited from entering the same class the following year.

Entries are prominently displayed at the MS&T Conference following judging.  In addition, selected winning entries may be displayed at ASM Headquarters and/or featured in ASM publications and electronic media.

See the left navigation options for more information on the rules, judging guidelines, shipping information, etc.

For further information, email: Steven Gentz (contest Chair) at: steven.j.gentz@nasa.gov