ISTFA 2017 Hero

ISTFA 2017

  • November 5-9, 2017
  • Pasadena Convention Center
  • Pasadena, CA, USA

Technical Program Listing

ISTFA's 2017 General Info

Plan today to attend ISTFA 2017!  This year's theme is ‘Striving for 100% Success Rate'



Be sure to download the mobile app for the most up to date technical schedule and attendee information! Available for both Apple and Android devices. Check out our How To Guide to get the most out of it!

The value of Failure Analysis is fully realized when the root cause of problem successfully identified in a timely manner. The process of performing failure analysis often requires irreversible operations to the failing device. Every day, failure analysts are challenged to perform operations on the failing device without altering the functionality of the device or destroying the physical evidence of the defect. New products and technologies add extra dimensions to this challenge. The International Symposium for Testing and Failure Analysis (ISTFA) offers the best venue to failure analysts for acquiring the knowledge and the resources needed to take on these challenges.  At ISTFA, you can learn from the experts about the tools and techniques needed for maximizing Success Rate in every aspect of Electronic Device Failure Analysis process. You can network with other failure analysts who can offer critical technical advice, and you will learn about state-of-art tools to meet your analysis challenges at the exposition. You can also participate as an expert presenter, teaching your novel idea or technique to the FA community.

2017 EDFAS Video Contest

Submit Your VIDEO Today!

2017 Keynote

Adam Steltzner
Team Leader & Chief Engineer EDL, NASA Mars Rover Curiosity & Author

Tuesday, November 7
9:15 a.m. - 10:30 a.m.

The Right Kind of Crazy: A True Story of Teamwork, Leadership and High Stakes Innovation


2016 Highlights

Best Paper
VLP… Demonstrating 110 nm Resolution in Common Laser Probing Applications
Mr. Patrick Pardy
, Intel Corporation

Outstanding Paper
Root Cause Analysis for Pin Leakage

Best Poster
Validation of DLS data by LVP in case of marginal failure
Keonil Kim, Samsung Electronics S.SLI division

Outstanding Poster
Sample Preparation Challenges in removing Copper Pillar WLCSP Device Embedded in PCB Module for Electrical Testing and Failure Analysis
Kah Chin Cheong, ON Semiconductor

Best Student Poster
Solder Ball Reliability Assessment of WLCSP Through Power Cycling
Bhavna Conjeevaram, University of Texas Arlington

Best Video
ACETONEMENT aka: Where did the Bond Wires Go?
Timothy Hazeldine, ULTRA TEC