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Call for Papers

Call for Papers

The call for papers is now closed.

Share your experiences and advance the industry and your career at the 43rd International Symposium for Testing and Failure Analysis (ISTFA), the premier event for the microelectronics failure analysis community. We invite you to submit your work for publication and to present to the industry in Pasadena, California for the 43rd year of ISTFA.

  • Original, unpublished, and novel material was solicited on testing, analysis, characterization, and metrology of electronic devices and systems from the nanoscale and upward.

  • Case studies, review papers, and non-commercial work from vendors are encouraged.

  • Technical symposia, user groups, seminars, short courses, and the largest equipment exposition in the industry make ISTFA the best place to learn, network, and further your career!

Paper selection is based entirely on information submitted in abstracts and will be evaluated on novelty, completeness, quality, and benefit to the FA community. Submit your minimum two-page abstract including images, figures, and references.


Attention Student Presenters...10 Free Registration Scholarships will be awarded to the 10 best student abstract submissions. To be eligible you must be a current full-time student. During the abstract submission you will be given the chance to identify yourself as a student. The winners will be notified in June.
 

Original, unpublished abstracts were solicited in the following topic areas:

  • Emerging FA Techniques
  • Nanoprobing and Electrical Characterization
  • Sample Preparation and Device Deprocessing
  • Low Power Devices Case Studies
  • Mixed Mode & High Power Devices Case Studies
  • FA Processes Case Studies
  • Reverse Engineering
  • Detecting and Preventing Counterfeit Microelectronics
  • Board and System Level FA
  • FIB Circuit Analysis and Edit
  • 3D Device Failure Analysis
  • Packaging & Assembly
  • Scanning Probe Analysis
  • Microscopy
  • Fault Isolation
  • FIB Sample Preparation
  • Product Yield, Test & Diagnostics
  • Space Application FA

 

Please note, authors are allowed to present a maximum of two papers (oral or poster).