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Education Course Details

Education Course Details

Saturday, November 4, 2017


Fault Isolation Techniques for Failure Analysis
8:30 a.m. - 4:30 p.m.

Instructor: David Vallett

Member: $525
Non-Member: $625
Student: $199

 

Yield Analysis for Systematic Defect Failure Analysis: Theory and Applications
CANCELLED DUE TO LOW PARTICIPATION

Instructor: Rao Desineni and Manish Sharma

 

Beam-Based Defect Localization
12:30 p.m. - 4:30 p.m.

Instructor: Ed Cole

Member: $249
Non-Member: $375
Student: $199