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Hitachi High-Tech micro-spot XRF analyzer now offered by Eastern Applied Research
March 22, 2019
Eastern Applied Research, Buffalo, N.Y., recently named as an Authorized Distributor of Hitachi High-Tech Science Corp., now offers an XRF analyzer developed for ultrathin film measurements and micro-spot analysis needs: the Hitachi FT-150 series.Cambridge spin-out company produces graphene sheets one atomic layer thick for wafers
March 22, 2019
Paragraf, a recent University of Cambridge spin-out company in England, has started producing graphene – a sheet of carbon just one atomic layer thick – at up to eight inches (20 cm) in diameter, large enough for commercial electronic devices.Rigaku EDXRF instrument analyzes elements from Na through U in almost any matrix
March 22, 2019
Rigaku, Japan, announces the newest addition to the NEX DE series, the Rigaku NEX DE VS direct excitation variable-spot EDXRF elemental analyzer, which is uniquely suited for small spot analysis applications.Bruker wins IF Design awards for three different spectrometer products
March 22, 2019
Bruker, Munich, has been awarded the IF (International Forum) Design Award for three different products: the FT-IR spectrometers Invenio and Alpha II, as well as the FT-NIR spectrometer MPA II in the categories “Industry” and “Medicine/Health” of the discipline “Product Design.”SEMI launches initiative to build talent pipeline critical to global electronics industry
March 22, 2019
SEMI, Mil[pitas, Calif., the global industry association serving the electronics manufacturing supply chain, announces SEMI Works, a comprehensive program to attract, develop and retain the talent critical to the worldwide electronics industry’s continued innovation and growth.
