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February 24, 2018Edax Inc., Mahwah, N.J., introduces the latest revision of its Apex analysis software, which was developed to ensure high-quality results that accelerate and simplify compositional analysis.
February 24, 2018Jeol USA, Peabody, Mass., offers the JSM-IT500HR InTouchScope, a scanning electron microscope that is said to deliver high-resolution field emission SEM performance with the ease of operation of Jeol’s Tungsten SEMs.
February 24, 2018Olympus, Japan, has developed the MX63/MX63L microscopes, which provide MIX observation technology that produces unique observation images by combining darkfield with another observation method, such as brightfield, fluorescence, or polarization.
February 24, 2018Brewer Science Inc., Monterey, Calif., launches its Sensor System Solutions program, which provides full consulting services to support customers from design through integration, to achieve complete, high-performance electronic systems.
February 24, 2018Advanced Semiconductor Engineering Inc., Taiwan, and Cadence Design Systems Inc., San Jose, Calif., announce that they have collaborated to release a System-in-Package (SiP) EDA solution that addresses the challenges of designing and verifying Fan-Out Chip-on-substrate multi-die packages.