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Edax launches new revision of Apex software for energy dispersive spectroscopy systems

February 24, 2018

Edax Inc., Mahwah, N.J., introduces the latest revision of its Apex analysis software, which was developed to ensure high-quality results that accelerate and simplify compositional analysis.

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Jeol InTouchScope SEM provides long-life emitter and resolution of 1.5nm at 30kV

February 24, 2018

Jeol USA, Peabody, Mass., offers the JSM-IT500HR InTouchScope, a scanning electron microscope that is said to deliver high-resolution field emission SEM performance with the ease of operation of Jeol’s Tungsten SEMs.

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MIX microscope observation method combines darkfield with brightfield to detect flaws

February 24, 2018

Olympus, Japan, has developed the MX63/MX63L microscopes, which provide MIX observation technology that produces unique observation images by combining darkfield with another observation method, such as brightfield, fluorescence, or polarization.

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Brewer Science launches Sensor System Solutions for customized sensor development

February 24, 2018

Brewer Science Inc., Monterey, Calif., launches its Sensor System Solutions program, which provides full consulting services to support customers from design through integration, to achieve complete, high-performance electronic systems.

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Cadence and Advanced Semiconductor develop SIP-EDA solution for multi-die packages

February 24, 2018

Advanced Semiconductor Engineering Inc., Taiwan, and Cadence Design Systems Inc., San Jose, Calif., announce that they have collaborated to release a System-in-Package (SiP) EDA solution that addresses the challenges of designing and verifying Fan-Out Chip-on-substrate multi-die packages.

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