With two devices FISCHERSCOPE XDAL and FISCHERSCOPE XDV, the Helmut Fischer Group, Germany, introduced an all-new generation of its high-end segment for coating thickness measurement and material analysis using X-ray fluorescence (XRF).
These benchtop devices not only impress with their modern facelift, but also with their faster and smarter measuring processes and many useful features. In combination with the AI-supported XRF software FISIQ X, Fischer is presenting its flagship products in an entirely new light, making them real game changers for even more efficient and accurate quality control.
For anyone who values high-precision and particularly reliable XRF measurements, Fischer is the right choice. Compared to their previous models, the new FISCHERSCOPE XDAL and FISCHERSCOPE XDV devices achieve 6 times faster positioning of the Z-axis, 14 times faster autofocus with a focusing time of less than 2 seconds, and 10 times higher resolution.
Equipped with a powerful overview camera and modern multi-zone LED lighting, these devices provide the optimum illumination for the most accurate analyses for all types of surfaces – whether matte, glossy, or reflective.
Making measurements even more efficient while maintaining market-leading accuracy – this has been achieved with these new products. The optimized spacing between X-ray tube, sample, and detector ensures maximum intensity output and guarantees consistently high-quality and repeatable measurement results.
Other useful features such as a device status lighting, an automated measurement hood, and a broad selection of standardized calibration workflows, top off the package.
As high-performers, these new devices span an outstanding wide range of different applications. While the FISCHERSCOPE XDAL is geared towards the electroplating, coating and PCB industries, among others, the FISCHERSCOPE XDV serves applications in branches such as semiconductor, energy, automotive, banking and customs, hallmarking, jewelry, and watches.
The new device generation is accompanied by a completely new software solution. With FISIQ X, the Helmut Fischer Group has launched the first and only XRF software with AI-supported spectrum mode to the market. Thanks to improved algorithms, it calculates the measuring results up to 6 times faster for coating thickness measurement and up to 13 times faster for material analysis.
The modern and intuitive user interface offers a completely new user experience and ensures that even inexperienced users will always receive the best possible support for easy measurements.
For more information:
Helmut Fischer Group
https://www.helmut-fischer.com/
