Lasertec, Japan, introduces its Optelics Hybrid microscope, which combines a confocal scanning laser microscope with a full-color confocal microscope. The confocal scanning laser microscope provides high magnification, high resolution, and highly accurate 3D measurements. The full-color confocal microscope provides a wide field of view and real color.
Featuring a new 405-nm laser light source, the Optelics Hybrid provides clear images from noncontact observation of extremely small structures in the nanometer-scale world. It uses a xenon lamp, which produces a spectrum of light similar to that of sunlight. Full-color confocal provides high-resolution images with good color separation and high depth of field. The microscope visualizes small bumps and dents on samples by the combined use of confocal and differential interference (DIC) optics.
Its field of view is approximately 1.6 times wider than a typical scanning laser microscope having a lens of equal magnification. Patchwork is used to generate a wide FOV image by joining smaller images, allowing operators to perform measurement of large samples with ease.
In addition, the Optelics Hybrid needs only 1/20 of the time required by a typical scanning laser microscope to generate a patchwork image of equal size, because it requires a fewer images (1/5) and a shorter measurement time per image (1/4).
