Jeol USA, Peabody, Mass., introduces the new JSM-7200F FE SEM with ultrahigh spatial resolution of 1.6 nm at 1.0 kV, and high probe current of 300 nA. Featuring through-the-lens detectors that can collect a variety of signals by varying the built-in energy filter, it produces a large amount of data in a very short amount of time. Seamless observation and analysis using EDS, WDS, EBSD, STEM, BSE, and CL can be conducted easily and efficiently. It is a compact system designed for easy installation and operation.
The JSM-7200F is an all-in-one SEM designed for any type of sample or analysis, including semiconductor devices, magnetic samples, and nonconducting materials. It is the latest addition to Jeol’s Field Emission SEM family, which includes the JSM-7800F Prime with unmatched extreme high resolution and low and high kV (7Å at both 1.0kV and 15kV) operation. For the fast-paced manufacturing environment, the JSM-7200F is a high-throughput, easy-to-use FE SEM. For the research environment, it offers the analyst a wide variety of contrast mechanisms.
When integrated with Gatan 3View Serial Block Face Imaging System, the JSM-7200F is ideal for neuroscience applications or any other 3D tomography imaging application. A new Soft X-ray Emission Spectrometer designed for JEOL FE SEMs and microprobes allows efficient and parallel collection of very low energy-rays (WDS) with chemical state analysis.
The JSM-7200F offers the best resolution in its class for an entry level Field Emission SEM with a wide variety of analytical functions, fast acquisition with minimum beam dwell time, and a user-friendly interface for a multi-user environment with remote operation and diagnostics.
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