MTI Instruments, Albany, N.Y., introduces the MTII/Fullam SEMtester compact mechanical test system, which is specifically designed to fit inside scanning electron microscopes. These systems are capable of carrying out fatigue, compression, bending, and tensile testing, making them ideal testers for materials scientists and researchers. Grain rotation, crack propagation, and various other tests of mechanical stress can be observed during testing under high magnification in an electron microscope.
This provides greater insight into the early stages of material failure and an enhanced overall understanding of the performance of particular materials. MTII/Fullam uses the MtestQuattro material testing system from Admet Inc. to control experiments and collect data.
A user-friendly interface to set system test parameters and analyze data is provided. During the testing stage, results are provided in real time and stress-strain curves are generated. Significant parameters such as modulus of elasticity, offset yield, peak load/stress, and other measurements are also reported.
It is also possible to export raw test data and results in standard formats, making it easy to integrate with other data analysis and laboratory management systems.
MTII/Fullam provides a variety of custom clamps for almost all shapes of materials. Quick connect mounting fixtures are also available for flawless integration into most major microscopy tools. Users are able to install systems without modification to vacuum chambers or microscopes with the help of post covers and adapters.
The SEMtester line of products is capable of doing compression, bending, tensile, creep and fatigue testing on a wide range of materials. Deformation and relaxation behavior can be monitored under static or dynamic loading. Optional thermoelectric heaters/coolers or sample heaters can be used during testing to simulate actual operating conditions.
http://www.mtiinstruments.com/
