Bruker, Madison, Wis., and Dectris, Switzerland, announce that they have collaborated to integrate the Dectris Eiger2 R 500K hybrid photon counting pixel detector with the Bruker D8 Advance and the D8 Discover instrument platform to further improve performance for numerous X-ray diffraction applications.
The most recent generation of the proprietary Eiger HPC detector offers a distinctive set of enhanced and new benefits for XRD: high frame rate enabling 2D data collection in continuous scanning mode, single photon counting without spatial distortion, and highest count rates and dynamic range. In combination with the Bruker D8TM X-ray diffraction systems, switching between 0D, 1D, and 2D mode is possible.
These new features are fully integrated into the Bruker D8 X-ray diffraction systems, and enable the Eiger 2 R 500K detector to produce excellent diffraction data for applications from powder diffraction, micro diffraction, texture or residual stress analysis, crystallite size determination, thin film analysis by X-ray reflectometry, and high-resolution diffraction to small angle X-ray scattering. This powerful combination of the D8 Advance or the D8 Discover with the Eiger2 R 500K significantly extends and speeds up the analysis capabilities for XRD users.
“Collaborating from the early stage in the product development, we were able to provide our new Eiger2 R 500K detector with seamless integration into the Bruker AXS D8 XRD systems. This is enabling customers to take advantage of cutting-edge detector technology for their laboratory right from the launch,” said Christian Broennimann, the CEO of Dectris.
