Nikon Instruments, Melville, N.Y., and Jeol USA, Peabody, Mass., have developed a powerful yet economical benchtop scanning electron microscope: the JCM-6000Plus NeoScope, a touch-panel controlled multifunctional SEM. It is a high-performance system in a compact, innovative model that provides intuitive touch-panel operation with a new graphical user interface.
The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire contrast information about specimen composition, and enabling efficient analysis. The series continues to include high-vacuum functionality and a secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification.
Secondary electron imaging and backscattered electron imaging are supported at high vacuum. A new high-sensitivity solid state backscattered electron detector provides both composition and topographic imaging information. Dual frame imaging has been added to facilitate comparison of live and retrieved images, as well as a wide magnification range from 10X (for wide area of view) up to 60,000X.
