Zeiss Research Microscopy Solutions, Germany, introduces the Advanced Reconstruction Toolbox with an upgraded Zeiss OptiRecon module for iterative reconstruction, and the Zeiss DeepRecon module, microscopy’s first commercially available deep learning reconstruction technology.
The Advanced Reconstruction Toolbox, available on Zeiss Xradia 3D X-ray platforms, will enable continuous access to the latest technologies available for reconstruction, providing flexible strategies as researchers’ imaging needs evolve. Based on advancing reconstruction technologies beyond the typical “filtered back projection” or Feldkamp-Davis-Kress (FDK) algorithms, this AI-based toolbox enables fewer projections. This reduces scan times by up to 10X, depending on module and material.
Advancements in image reconstruction intelligence extend 3D X-ray technology to a wide range of manufacturing, process, and quality control applications. At the same time, both OptiRecon and DeepRecon modules retain image quality, or offer greatly improved image quality for many applications. The traditional challenge of choosing either image quality or sample throughput has been resolved with these new capabilities.
OptiRecon allows researchers to achieve superior interior tomography or throughput on a broad class of samples with improved contrast-to-noise ratios. DeepRecon increases speed by up to an order of magnitude for sample classes with repetitive workflows, making 3D X-ray microscopy even more attractive as a solution for manufacturing, process, and quality control applications.
