J.A. Woollam, Lincoln, Neb., has worked closely with Linkam Scientific, Surrey, U.K., to bring precise temperature control to its custom ellipsometry instruments. By adapting Linkam Scientific’s heat stages, the collaboration provides thin film researchers with customized temperature controlled ellipsometers for a broad set of applications.
Both ellipsometry and thermal analysis are fundamental characterization tools for studying thin film materials. There are many applications where it is necessary to measure optical properties at different temperatures in real-time, from bio-coatings and hydrogels for contact lenses to transparent electronics and medical devices. Temperature-controlled ellipsometry enables the characterization of a range of properties, such as thermal expansion coefficients, which can be determined by monitoring changes in thickness versus temperature.
Linkam Scientific modified the HFS600, one of its most widely used heating stages, with a special optical adapter to use on an ellipsometer. This adapted temperature controller, the HFSEL600, allows all J.A. Woollam systems to make temperature-dependent ellipsometry measurements over a wide temperature range. Samples can be characterized by heating quickly to within a few degrees of the required temperature at rates of up to 150°C/min and then slowly at a few tenths of a degree per minute to closely examine sample changes.
Jeremy Van Derslice, applications engineer at J.A. Woollam comments on the value of this partnership: “The strength of combining the expertise from each company provides thin film researchers with personalized temperature-controlled ellipsometers. Integrating ellipsometers with Linkam’s HFSEL600 heating stage, for highly precise and accurate temperature control, provides the ideal instrumentation to characterize versatile materials. Researchers can test their materials in new ways and ensure the thickness and optical properties of their films are appropriate for their application.”
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