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1458 items found
Ametek acquires VTI Instruments for its high-accuracy test/measurement solutions
Published: February 12, 2014
Ametek Inc., Berwyn, Pa., announces that it has acquired VTI Instruments, Irvine, Calif., which manufactures a wide range of signal conditioning and switching instruments, data acquisition solutions, and integrated test systems.
News, Magazine & Media / Industry News
Predicting new forms of insulating materials
Published: February 07, 2014
Topological insulators have been of great interest to physicists in recent years because of unusual properties that may provide insights into quantum physics.
News, Magazine & Media / Industry News
ASM International debuts revamped website
Published: February 06, 2014
ASM International, Materials Park, Ohio, recently rolled out a major redesign of their company website.
News, Magazine & Media / Industry News
Scanning Microwave Impedance Microscopy for nanoscale mapping of permittivity and conductivity
Published: January 21, 2014
Asylum Research, Santa Barbara, Calif., an Oxford Instruments company, has developed Scanning Microwave Impedance Microscopy (sMIM), an atomic force microscopy technique that enables nanoscale mapping of permittivity and conductivity.
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Instrument measures silicon wafer thickness and TSV depths prior to grinding
Published: January 21, 2014
Lasertec U.S.A., San Jose, Calif., introduces the WASAVI Series BGM300. This instrument measures silicon wafer thicknesses and TSV depths prior to back grinding 3D semiconductor devices.
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Bruker stylus profiler enables 300-mm wafer analysis
Published: January 21, 2014
Bruker Nanosurfaces Division, Billerica, Mass., introduces the Dektak XTL Stylus Profiler, extending its stylus profilometry capabilities to 200 and 300 mm semiconductor wafer fabs and next-generation touch panel manufacturers.
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Industry consortium to develop secure semiconductors and systems
Published: January 21, 2014
Semiconductor Research Corporation (SRC), Research Triangle Park, N.C., has launched a new initiative on Trustworthy and Secure Semiconductors and Systems (T3S).
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Cadence Incisive 13.2 verification platform enables faster performance
Published: January 21, 2014
Cadence Design Systems, Inc., San Jose, Calif., introduces a faster version of the Incisive functional verification platform.
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Imec celebrates 30 years of nanoelectronics industry innovation
Published: January 21, 2014
Imec, Belgium, celebrates its 30th anniversary. Founded in 1984 as a non-profit organization, it has enabled notable advancements in global semiconductor chip manufacturing in the three decades since its founding.
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Soliciting EDFAS Board Nominations
Published: January 21, 2014
EDFAS is soliciting nominations for candidates for the EDFAS Board of Directors (BOD). Terms are for four years, beginning September 1, 2014 and ending August 31, 2018. All potential candidates for the BOD must be members in good standing of EDFAS at the time of their candidacy.
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