Bruker AXS X-ray diffraction systems integrated with Dectris Eiger pixel detectors
September 24, 2017 Source:
Bruker, Madison, Wis., and Dectris, Switzerland, announce that they have collaborated to integrate the Dectris Eiger2 R 500K hybrid photon counting pixel detector with the Bruker D8 Advance and the D8 Discover instrument platform to further improve performance for numerous X-ray diffraction applications.
The most recent generation of the proprietary Eiger HPC detector offers a distinctive set of enhanced and new benefits for XRD: high frame rate enabling 2D data collection in continuous scanning mode, single photon counting without spatial distortion, and highest count rates and dynamic range. In combination with the Bruker D8TM X-ray diffraction systems, switching between 0D, 1D, and 2D mode is possible.
These new features are fully integrated into the Bruker D8 X-ray diffraction systems, and enable the Eiger 2 R 500K detector to produce excellent diffraction data for applications from powder diffraction, micro diffraction, texture or residual stress analysis, crystallite size determination, thin film analysis by X-ray reflectometry, and high-resolution diffraction to small angle X-ray scattering. This powerful combination of the D8 Advance or the D8 Discover with the Eiger2 R 500K significantly extends and speeds up the analysis capabilities for XRD users.
"Collaborating from the early stage in the product development, we were able to provide our new Eiger2 R 500K detector with seamless integration into the Bruker AXS D8 XRD systems. This is enabling customers to take advantage of cutting-edge detector technology for their laboratory right from the launch," said Christian Broennimann, the CEO of Dectris.
Bruker, Madison, Wis., and Dectris, Switzerland, announce that they have collaborated to integrate the Dectris Eiger2 R 500K hybrid photon counting pixel detector with the Bruker D8 Advance and the D8 Discover instrument platform to further improve performance for numerous X-ray diffraction applications.
The most recent generation of the proprietary Eiger HPC detector offers a distinctive set of enhanced and new benefits for XRD: high frame rate enabling 2D data collection in continuous scanning mode, single photon counting without spatial distortion, and highest count rates and dynamic range. In combination with the Bruker D8TM X-ray diffraction systems, switching between 0D, 1D, and 2D mode is possible.
These new features are fully integrated into the Bruker D8 X-ray diffraction systems, and enable the Eiger 2 R 500K detector to produce excellent diffraction data for applications from powder diffraction, micro diffraction, texture or residual stress analysis, crystallite size determination, thin film analysis by X-ray reflectometry, and high-resolution diffraction to small angle X-ray scattering. This powerful combination of the D8 Advance or the D8 Discover with the Eiger2 R 500K significantly extends and speeds up the analysis capabilities for XRD users.
“Collaborating from the early stage in the product development, we were able to provide our new Eiger2 R 500K detector with seamless integration into the Bruker AXS D8 XRD systems. This is enabling customers to take advantage of cutting-edge detector technology for their laboratory right from the launch,” said Christian Broennimann, the CEO of Dectris.
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