Electronic Device Failure Analysis Society

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ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis

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$167.00Member Price:$125.00

Description

The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

ASM Affiliate Societies