Graphite sheets to help next-gen smartphones keep cool

Published: October 16, 2020

Researchers at King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabia, developed a fast and efficient way to make a carbon material that could be ideally suited to dissipating heat in electronic devices such as cooling the powerful electronics packed inside the latest smartphones.

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A touch of gold sends crystals electric with excitement

Published: October 16, 2020

Physicists at the University of Warwick, Coventry, U.K., demonstrate a display of modern-day alchemy.

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NIST scientists build a better nanoscale LED

Published: October 16, 2020

A new design for light-emitting diodes (LEDs) developed by a team of scientists at the National Institute of Standards and Technology (NIST), Gaithersburg, Md., may hold the key to overcoming a light source’s long-standing efficiency limitation.

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Gowin Semiconductor launches GoAI 2.0 for embedded machine learning inference

Published: October 16, 2020

Gowin Semiconductor Corp., San Jose, Calif. and Guanzhou, China, releases the latest version of their GoAI machine learning platform, providing an SDK and accelerator to perform machine learning for edge inference using convolutional neural networks on Gowin field-programmable gate arrays (FPGAs).

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J.A. Woollam and Linkam Scientific bring precise temperature control to its ellipsometry instruments

Published: October 16, 2020

J.A. Woollam, Lincoln, Neb., has worked closely with Linkam Scientific, Surrey, U.K., to bring precise temperature control to its custom ellipsometry instruments.

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Bruker releases new suite of benchtop 3D optical profiler systems

Published: October 05, 2020

Bruker Nano Surfaces announces the release of its next-generation benchtop ContourX 3D optical profilometers for gage-capable surface texture and roughness metrology in R&D and manufacturing environments.

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Zeiss Group segments Carl Zeiss Meditec and Zeiss SMT nominated for innovation award

Published: September 25, 2020

The Zeiss Group, Germany, announces that two Zeiss teams have been nominated for the Deutscher Zukunftspreis – the Federal President's Award for Innovation in Science and Technology, the first time that two segments of the same company have been nominated.

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ON Semiconductor applies electro-optical probing for topside die failure analysis

Published: September 21, 2020

Engineers from ON Semiconductor presented a discussion of the electro-optical probing technique for failure analysis at the wafer and die level, at the ASM International ISTFA 2019 conference in Portland, Oregon.

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Thermo Fisher FA technique uses SEM to probe electrical waveforms on FinFET transistors

Published: September 21, 2020

Engineers from Thermo Fisher Scientific presented a discussion of a technique in which the voltage-contrast mechanism of a scanning electron microscope is used to probe electrical waveforms on FinFET transistors that are located within active integrated circuits.

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Global Foundries and Mentor evaluate net tracing solutions for hotspot analysis

Published: September 21, 2020

Engineers from Global Foundries and Mentor presented a discussion of “Automated Multi-level Circuit Net Trace for Hotspot Analysis” at the ASM International ISTFA 2019 conference in Portland, Oregon.

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