Bruker’s new XRD system combines its Turbo X-ray source with Atlas goniometer

Published: September 06, 2017

Bruker AXS, Billerica, Mass., introduces the D8 Discover Plus X-ray diffraction system, which combines the high power of its TXS-HE high-efficiency Turbo X-ray source, with the reliability and accuracy of its high-endurance Atlas goniometer.

News, Magazine & Media / Industry News

Fast silicon drift detector combined with EDS analysis software enables real-time imaging

Published: August 21, 2017

Oxford Instruments, Concord, Mass., introduces a real-time navigation and imaging system for the SEM that helps users interactively explore samples based on video-rate X-ray maps colored by element rather than the black and white electron image alone.

News, Magazine & Media / Industry News

Magnetic/electrostatic compound lens enables FIB/SEM to image sub-nanometer features

Published: August 21, 2017

Hitachi High-Technologies Corp., Tokyo, announces the development of an all-new high-performance Ethos FIB-SEM based on a newly developed magnetic/electrostatic compound lens that enables it to deliver advanced imaging performance resolving sub-nanometer features in high contrast for low-voltage SEM applications.

News, Magazine & Media / Industry News

Jeol InTouchScope SEM offers high sensitivity and high spatial resolution at faster speed

Published: August 21, 2017

Jeol USA, Peabody, Mass., introduces the newest addition to the Jeol InTouchScope series SEMs, the JSM-IT500HR, which features a high-brightness, long-life emitter with stable probe current.

News, Magazine & Media / Industry News

Coventor adds automated process analysis to semiconductor virtual fabrication platform

Published: August 21, 2017

Coventor Inc., Cary, N.C., announces the availability of SEMulator3D 6.1, the latest version of its semiconductor virtual fabrication platform.

News, Magazine & Media / Industry News

Micron’s new facility nearly doubles cleanroom space for memory storage R&D

Published: August 21, 2017

Micron Technology Inc., Boise, Idaho, has opened a new facility that will nearly double the cleanroom space dedicated to research and development, and will support a significant expansion of the company's overall R&D capabilities.

News, Magazine & Media / Industry News

Software enables SEM analysis of multi-layer structures without cross-sectioning

Published: August 12, 2017

Bruker Nano Analytics, Oak Park, Ill., introduces XMethod, the world's first software package for the analysis of composition and thickness of single or multiple layers, based on data obtained by sample excitation with the XTrace micro-focus X-ray source for scanning electron microscopes.

News, Magazine & Media / Industry News

Imaging instrument for electronics combines thermal camera, temperature measurement

Published: August 11, 2017

Flir Systems, Wilsonville, Ore., introduces the ETS320, a thermal imaging and temperature measurement instrument for electronic components and printed circuit boards.

News, Magazine & Media / Industry News

Mid-year global semiconductor sales up 21% compared to 2016

Published: August 09, 2017

The Semiconductor Industry Association (SIA), Washington, reports that worldwide sales of semiconductors reached $97.9 billion during the second quarter of 2017, an increase of 5.8% over the previous quarter and 23.7% more than the second quarter of 2016.

News, Magazine & Media / Industry News

Compact scanning TEM microscope offers fast changes between imaging and analysis

Published: August 09, 2017

Thermo Scientific, Hillsboro, Ore., introduces the Talos F200i compact scanning transmission electron microscope (S/TEM), which can be customized to meet specific imaging and analytical requirements.

News, Magazine & Media / Industry News