Cascade Microtech Inc., Beaverton, Ore., has developed the CM300 Probe System, which automates on-wafer device measurements and enhances device and process characterization and modeling by capturing the true electrical performance of devices, thus enabling hands-off productivity. The system allows a high degree of measurement complexity and test flexibility to measure I-V, C-V, and RF over a broad temperature range.
Future innovations, such as support for 1/f measurements, will extend its capabilities. With fast and well-characterized thermal transition and probe-to-pad alignment, the CM300 processes a high volume of measurement data with accuracy on pads as small as 30 µm. The CM300’s highly configurable and scalable platform provides upgrade paths for measurement capability, application flexibility, and test automation.
The CM300 was voted “Best in Test” in the category of Semiconductor Test by EDN, part of UBM Tech’s portfolio of communities for the electronics industry, to honor important and innovative new products and services in the electronics test and measurement industry.
Since its introduction in January of 2013, the CM300 has been selected for the engineering labs of major foundries, integrated device manufacturers, and leading fabless companies. The product’s flexibility and scalability are contributing to its early success in the market.
http://www.cascademicrotech.com
