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Bruker D8 Gen 2 crystallography platform optimized for X-ray diffraction

Bruker AXS, Madison, Wis., introduces the D8 Gen 2, which features the latest version of the Incoatec Microfocus Source, the IµS 3.0, the first microfocus source specifically designed and optimized for X-ray diffraction. Previous microfocus sources feature electron optics and anode geometries that are designed for non-scientific applications such as nondestructive testing, and are thus not fully optimized for X-ray diffraction.

By completely redesigning the X-ray source, the IµS 3.0 increases X-ray intensity by 70% compared to conventional microfocus sources. At the same time, it retains the legendary reliability of the IµS family, backed by a full three-year warranty.

The D8 Gen 2 will become available in the D8 Quest and D8 Venture, and features the ground-breaking, new Photon IITM detector. For the first time, the Photon II harnesses advanced Charge Integrating Pixel Array Detector (CPAD) technology, originally developed for X-ray Free Electron Lasers (XFELs). The Photon II features the largest monolithic active area of 10×14 cm2, the highest detection quantum efficiency, and the highest frame rate of any laboratory detector. By design, the Photon II also completely eliminates the charge-sharing noise and parallax issues that plague the current generation of Pixel Array Detectors (PADs).

The advanced technology is complemented by the completely new Apex3 software package. It greatly enhances the crystallographer’s productivity by integrating a new, highly intuitive user interface with advanced new analysis engines for the investigation of twinned and intergrown samples and powder data. It also features new, best-ever structure solution, and refinement routines.

www.bruker.com

 

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