Nikon Metrology, Brighton, Mich., introduces Inspect-X 5.0, which supports a new 16M-pixel flat panel detector that enables four times better resolution for CT scans. Designed for Nikon’s range of X-ray and CT systems, the latest release of the Inspect acquisition and analysis software also features the Golden Image Comparison tool, which automatically displays a reference image alongside a radiograph image during an automated (electronics) inspection routine. This allows operators to intelligently and immediately make a pass/fail sentence on the part being inspected.
Because Inspect-X 5.0 is now a native 64-bit application, it can support the higher resolution detectors that offer sharper and clearer images. Also, the 64-bit system achieves faster processing and analysis, offering quicker insight and higher productivity.
Inspect-X 5.0 also supports a new 16 M-pixel detector with pixels as small as 100 µm; this is four times better resolution than current comparable panels. With a much more detailed inspection, the high resolution imaging reveals all defects, thus contributing to a greater insight. The new supported panel is available for the XT H 225 ST, XT H 320, and XT H 450 CT systems.
