JEOL USA, Peabody, Mass., introduces a new scanning electron microscope that combines the performance of a field emission SEM with the simplicity of the JEOL InTouchScope SEM series. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter.
Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface topography and contrast.
A rugged in-chamber specimen stage and large chamber accommodate a wide variety of samples of different shapes, sizes, and weights, enabling users to secure large, heavy, and odd-shaped objects on the stage with clear positioning prior to evacuating the chamber.
The specimen chamber’s twelve geometrically-optimized analytical ports allow for multiple detectors, creating a virtual nano-lab inside the SEM. Low vacuum capability is a standard feature and allows for imaging and analysis of all types of samples in their native state. When configured with a JEOL EDS detector, fast analysis is done directly within the SEM software interface.
InTouchScope series SEMs are designed to make operation intuitive, and controlled through touchscreen interface using multi-touch gestures and/or traditional keyboard/mouse and operation panel. A ‘Navi’ mode guides operation from sample introduction to automatic condition setting for new or occasional users.
“As a global leader in scanning electron microscopy for over 50 years, we’ve just changed the rules of the game,” says Donna Guarrera, Asst. Director, SM Division, JEOL USA. “The JSM-IT300HR provides field emission performance on a very flexible but easy to use platform within a tungsten SEM’s price range.”
