Jeol USA, Peabody, Mass., offers the JSM-IT500HR InTouchScope, a scanning electron microscope that is said to deliver high-resolution field emission SEM performance with the ease of operation of Jeol’s Tungsten SEMs. With its high-brightness, long-life emitter, it delivers excellent fidelity at any kV. The JSM-IT500HR provides expanded performance over traditional W SEMs at a moderate price.
This state-of-the-art SEM, with its high-brightness electron gun system, provides high-resolution imaging along with high sensitivity and high spatial resolution analysis at even faster speeds. The IT500HR achieves a resolution of 1.5nm at 30kV, and 4nm at 1kV.
The large analytical chamber allows you to create a nano-lab with your SEM, with multiple ports to accommodate a wide variety of detectors. Multiple EDS detectors, WDS, EBSD, and CL detectors can all be installed. The column design ensures optimized geometry for all detectors.
The large specimen chamber with stage mounted inside allows easy sample loading and manipulation. By mounting the stage inside the chamber, users can secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber.
The IT500HR accommodates a wide variety of sample types. Low vacuum capability is built in, allowing for imaging and analysis of all types of samples in their native state.
Jeol’s analytical series includes a fully-embedded EDS system that provides real-time EDS spectra during image observation. With automated montaging, the SEM automatically collects montage images and EDS data.
