Bruker Corp., Oak Park, Ill., introduces its Quantax Compact EDS system, which consists of an XFlash 600 Mini silicon drift detector (SDD), a small electronics unit, and Eprit Compact intuitive software.
The system performs qualitative and quantitative analyses of all materials having an element range from boron (5) to californium (98). Besides composition analysis at individual spots on the sample surface, Quanax Compact provides powerful line scan and spectral element mapping functions.
The system is fully upgradeable to the complete Quantax EDS software suite. It is the only system that can integrate all four Bruker microanalysis techniques: EDS (for S/TEM, too), Electron Backscatter Diffraction (EBSD), Micro X-ray Fluorescence (µ-XRF), and Wavelength Dispersive Spectroscopy (WDS).
Researchers who need EDS on nano-structures and extremely beam-sensitive materials (semiconductor, polymer) may be interested in the FlatQuad annular EDS detector. This large-area detector provides the ultimate x-ray sensitivity for spectrum and x-ray map acquisition. With a take-off angle of up to 70 degrees, the FlatQuad can eliminate topography-induced EDS shadows.
