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Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology

Applied Rigaku Technologies Inc., Austin, Texas, a division of Rigaku Corp., introduces NEX CG II, a powerful second-generation benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer. The NEX CG II is a multi-element, multi-purpose indirect analyzer that delivers rapid qualitative and quantitative elemental analyses and addresses needs across many industries. It provides non-destructive elemental analysis of sodium to uranium in almost any matrix.

The NEX CG II complements Rigaku’s existing range of benchtop and in-line process control EDXRF spectrometers and builds on NEX CG’s legacy of using full 90° Cartesian Geometry and secondary targets for trace level sensitivity.

The new superior analytical power of the NEX CG II is provided by a 50 kV 50 W end-window palladium-anode x-ray tube, monochromatic or polarized excitation from five secondary targets, and a high-performance large-area silicon drift detector. This unique optical kernel, combined with Rigaku’s advanced RPF-SQX Fundamental Parameters software, delivers the most sensitive EDXRF measurements in the industry.

The NEX CG II serves a broad range of applications and industries and is an ideal tool for measuring ultra-low and trace element concentrations all the way up to percent levels.

Some of the key advantages and features that make NEX CG II an attractive proposition include:
•    Non-destructive elemental analysis for sodium (Na) to uranium (U)
•    Rapid elemental analyses of solids, liquids, powders, coatings, and thin films
•    Indirect excitation for exceptionally low detection limits
•    High-power 50 kV, 50 W x-ray tube
•    Large-area high-throughput silicon drift detector (SDD)
•    Analysis in air, helium, or vacuum
•    Powerful and easy to use QuantEZ software with multilingual user interface
•    Advanced RPF-SQX Fundamental Parameters software featuring scattering FP
•    Rigaku profile fitting (RPF) advanced algorithm for peak deconvolution
•    Various automatic sample changers accommodating up to 52 mm samples
•    Low cost of ownership backed by a two-year warranty

It is easy for non-technical operators to use and powerful enough for expert use in commercial labs and R&D facilities. NEX CG II also features 3D optics, which dramatically increases the peak-to-background ratio. This results in a spectrometer capable of trace element analysis — even in challenging sample types.

 

Image – Rigaku NEX CG II Advanced Cartesian Geometry EDXRF Spectrometer.

For more information:

Applied Rigaku Technologies
https://www.rigaku.com

 

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