Jeol USA, Peabody, Mass., introduces the JSX-1000S ElementEye, an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer. The instrument analyzes major to trace components on most sample types, including solids, powders, and liquids, with little or no sample preparation. It complements SEM, EPMA, NMR, and mass spectrometry analyses, providing high-sensitivity qualitative and quantitative analysis results in minutes. A Thin Film FP method is optionally available for non-destructive measurement of film thickness on coated samples.
High-sensitivity analysis can be performed across the entire energy range using a maximum of nine types of filters and a sample chamber vacuum unit. Features of the ElementEye include an optional 12-position auto sample changer; touch screen operation; pre-recorded recipes for standard solution applications – RoHS, Metals (Air/Vacuum), Oxides (Air/Vacuum), Organic Materials (Air/Vacuum) – high-sensitivity SDD and short-path optical system for high throughput analysis; and residual balance and thickness correction for organic samples.
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