Tescan, Warrendale, Pa., introduces the new GAIA3 FIB-SEM workstation, which builds on the success of the Tescan Lyra FIB-SEM workstation. The GAIA3 features a newly developed ultra-high resolution SEM column and integrated Raman system. The GAIA3 addresses all FIB-SEM application requirements in nanotechnology and semiconductors.
The proven third-generation design ensures the highest reliability and uptime with uncompromised ease of use for TEM sample preparation, advanced e-beam and ion lithography, and all forms of 3D characterization, including cryo integration. The workstation concept holds true for all multi-user environments, as the GAIA3 will enable novice and advanced users alike to achieve optimum results.
The GAIA3 newly designed electron column will provide <1.5 nm resolution at @ 1 keV and < 3 nm @ 30 keV ion column performance.
Tscan will deliver the first GAIA3 FIB-SEM workstation in October of 2014.
Tescan Orsay Holding is a leading provider of scientific instrumentation and is well known for its innovation and openness to work with researchers, customizing applications to fit specific needs. Established in 1991, Tescan is an ISO certified company with a long tradition of excellence.
