Edax Inc., Mahwah, N.J., has launched the Atom Probe Assist, a new tool designed to help users of atom probe tomography systems prepare specimens for faster and more efficient analysis than previously possible. This approach uses Transmission-Electron Backscatter Diffraction (t-EBSD) to collect crystallographic information from the specimen to quantifiably determine grain boundary position with high spatial resolution and precision.
The tool reduces the total time needed to obtain high-quality atom probe data, and accelerates progress in understanding questions such as grain boundary segregation. Designed for use with a Focused Ion Beam (FIB), the specimens are prepared by annular ion beam milling, and the position of the grain boundary is checked after each milling step.
Once the grain boundary is located in the optimal position for analysis, the preparation is complete. Thus, specimens are prepared and validated in a single instrument, eliminating the need to transfer the sample with a higher risk of damage or loss.
“There is great synergy between the Atom Probe Assist and Atom Probe characterization,” says Matt Nowell, EBSD Product Manager at Edax. “Not only can specimens be prepared more efficiently, but also the tool can be used to identify different grain boundary types by using traditional EBSD to help guide site-specific specimen preparation. The Atom Probe Assist has been designed with specialized features to make this process easy to operate while providing quality data,”
