Jeol USA, Peabody, Mass., introduces the 7000 series of Field Emission Scanning Electron Microscopes (FE-SEM) with ultrahigh resolution and low-kV/low-vacuum operation for imaging and nano-analysis of structures, surface details, and magnetic samples. The JSM-7800F Prime features a super hybrid lens that makes it possible to observe the finest structural morphology of nanomaterials at 1,000,000X magnification with seven-angstrom resolution at 1kV.
The instrument also makes it possible to collect large area EBSD maps at low magnifications without distortion; perform low kV imaging and analysis of highly magnetic samples; and image thin electron-transparent samples with sub-7Å resolution in STEM-in-SEM mode.
The JSM-7800F Prime uniquely combines an in-lens field emission gun with an aperture angle control lens, optimizing large probe currents (up to 200 nA) for operation at the smallest probe diameter. The SEM excels at low accelerating voltage X-ray spectroscopy and cathodoluminescence, combining large beam currents with a small interaction volume and dramatically increasing analytical resolution to the sub-100nm scale. Beam deceleration in GB Mode provides charge balance and extreme high resolution imaging of surfaces and nonconductive samples by effectively reducing effects of lens aberrations.
The JSM-7800F Prime is suitable for a wide variety of applications, from cryo-microscopy to electron beam lithography. It accommodates multiple analytical attachments, including EDS, WDS, STEM, BSE, CL, EBIC, and an IR camera and stage navigation camera. The SEM comes with a choice of three stage sizes and three specimen exchange airlock sizes. It can also be equipped with tensile, heating, and cooling stages for in situ experiments.
