Jeol USA, Peabody, Mass., introduces a new benchtop SEM, the JSM-6000Plus, the third generation of the NeoScope, which delivers fast, high-magnification electron microscopy with more functionality than typical benchtop SEMs. The simplicity of design with touchscreen operation make the NeoScope an ergonomic, easy-to-operate SEM for rapid inspection of electronics and a wide variety of materials and organic samples.
This model offers high sensitivity backscatter electron detection with a Jeol BSE detector to detect contrast between areas of the sample with different chemical compositions.
The instrument makes it possible to bring basic high resolution imaging and analysis features of a full-sized scanning electron microscope into the lab. It fits into both small spaces and economical budgets, and its simple operation and versatile functions complement the workflow with optical microscopes or larger SEMs.
Jeol understands that even the smallest microscope needs the flexibility of selectable high and low kV, selectable beam currents, and up to 60,000X magnification to be a valuable resource.
The Jeol NeoScope is the culmination of more than 50 years of expertise in SEM development and is supported by its award-winning service organization. The NeoScope is available exclusively from Nikon Metrology Inc., a leading supplier of optical microscopes, through a business alliance between Jeol and Nikon.
